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2024年3月22日发(作者:css教程 雪峰)

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专利名称:TEST FIXTURE ALIGNMENT SYSTEM

发明人:SWART, Mark, A.,JOHNSTON, Charles, J.,VAN

LOAN, David, R.

申请号:EP91911016.0

申请日:19910524

公开号:EP0531428A1

公开日:19930317

摘要: A test device for testing printed circuit boards, comprising a test probe array

(18) held in contact with a pattern of test points in a circuit array (22) printed on the circuit

board (20) . The circuit array is positioned relative to a reference mark (28) on the board

(20), and a pin hole on the board (20) is aligned with the circuit network. The test device

comprises a pin (24) inserted into the hole provided for this purpose to maintain the

circuit network (22) in fixed position relative to the test probe (18) during the

experiments. The reference mark (28) is detected, and an optical reading shows

misalignments of test points on the board relative to the probes. The pin (24) is set to

the test device (10) for moving the card (20) relative to the probes (18) so as to correct

the misalignment. Alignment of the card (20) on the test device (10) can be optically

detected through a lens system (104), a conduit image optical fiber (72), a light source

(96 , 98), an image magnifier (60) and a video probe (70) which reproduces images of the

reference mark and a zero reference point known on a television monitor (118).

申请人:EVERETT/CHARLES CONTACT PRODUCTS INC.

地址:700 East-Harrison Avenue Pomona California 91767 US

国籍:US

代理机构:Grünecker, Kinkeldey, Stockmair & Schwanhäusser Anwaltssozietät

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