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2024年12月27日发(作者:require的中文意思)

专利内容由知识产权出版社提供

专利名称:HOLDING DEVICE OF SUBSTRATE

发明人:OGATA TAKESHI,尾形 全,YAMAMOTO

SUMIMASA,山本 純正,KUBO HIROYOSHI,久保

博義

申请号:JP特願平4-357049

申请日:19921222

公开号:JP特開平6-196381A

公开日:19940715

专利附图:

摘要:PURPOSE:To prevent the flatness of a wafer on a wafer chuck from being

spoiled by dust particles or the like. CONSTITUTION:A wafer chuck 1 in which a wafer W1

has been sucked to its surface 1a is provided with a plurality of pin-shaped back

protrusions 3 on its back 1b, and the top part of each back protrusion 3 comes into

contact with a support face 2a on a support plate 2 for an aligner or the like. Even when

foreign bodies such as dust particles or the like exist between the wafer chuck 1 and the

support plate 2, a fear that the flatness of the wafer W1 is spoiled due to them is

reduced.

申请人:CANON INC,キヤノン株式会社

地址:東京都大田区下丸子3丁目30番2号

国籍:JP

代理人:阪本 善朗

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